X-ray free electron lasers rely on an accelerated electron bunch passing through an undulator to create and amplify x-ray pulses. This generation/amplification process leaves a signature on the electron bunch than is dependent on the temporal profile of the generated x-rays. By streaking the electron bunch after the generation and looking at the electron spectrum as a function of time it is possible to characterize the generated x-ray pulses on a shot to shot basis.
I am not going to present the paper itself, but if you want to include the link it could be useful to the curious attendee:
http://journals.aps.org/prstab/abstract/10.1103/PhysRevSTAB.14.120701
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